Before use (ver8.4 October, 2011)

(1) OUTLINE
TDK S-parameter Data Library is a set of S-parameter data of TDK's electronic components. This library contains inductors, multilayer ceramic capacitors, ferrite beads, chip varistors, 3-terminal filters, common mode filters, pulse transformers and baluns.
When simulating the behavior of a circuit at high frequencies using ideal elements, the result may differ significantly from the actual behavior. This is due to the high frequency contributions of parasitic components of real circuit devices. Actual behavior can be reflected by using this library as a black box.

(2) MEASUREMENT CONDITION
DUT is put on a micro-strip line and measured by Network Analyzer.

Test Board : Micro-strip line with 50 ohm characteristic impedance (FR4 0.4mm thick)
Temperature : 25 degreeC
Reference Plane : At the edge of the land pattern

(Note)
S-parameters of high frequency inductor (MLK,MLG and GLQ series) and a part of multi-layer ceramic capacitors are converted from the impedance data measured with impedance analyzer.

(3) WARNING
NOTE THAT THE DATA CONTAINED IN THIS "TDK S-parameter Data Library" IS BEING PROVIDED SOLELY FOR INFORMATIONAL PURPOSES. IN NO WAY SHALL THIS DATA BE CONSTRUED AS A WARRANTY BY TDK OF ANY PRODUCT CHARACTERISTICS AND/OR SPECIFICATIONS. WITHOUT LIMITING THE FOREGOING, TDK MAKES NO WARRANTIES OF ANY KIND, EXPRESS OR IMPLIED, RELATING TO THIS DATA, INCLUDING BUT NOT LIMITED TO THE IMPLIED WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE. Please refer to TDK's catalog or specifications for actual product characteristics. Note that any simulation results obtained through use of this data will not reflect the effects of room temperature or other environmental conditions. Accordingly, actual use of TDK's products is recommended as the only accurate means of conducting verification testing.
IN NO EVENT SHALL TDK BE LIABLE FOR ANY LOSS OR DAMAGE ARISING OUT OF THE USE OF THIS DATA, INCLUDING BUT NOT LIMITED TO ANY INCIDENTAL OR CONSEQUENTIAL DAMAGES.